Tseng, S. T. and Chiao, C. H. (1991),“A classification Rule for the Weibull-Inverse Power Model.”Proceedings of the Chinese Institute of Industrial Engineers National Conference, pp.130–135.
Tseng, S. T. and Chiao, C. H.(1994), “A Classification Rule Arising from Accelerated Life Test.” Reliability Engineering & System Safety, Vol. 43, No. 3, pp.247–256.[ SCI][ EI] Tseng, S. T., Hamada, M. and Chiao, C. H.(1995), “Using Degradation Data from a Fractional Factorial Experiment to Improve Fluorescent Lamp Reliability.” Journal of Quality Technology, Vol. 27, No. 4, pp.363–369[EI][SCI] Chiao, C. H. and Tseng, S. T. (1996), “Applying Locally Optimal Criterion for Classifying Highly-reliable Products with a Control.” Lifetime Data Analysis, Vol. 2, No. 2, pp.131–144. Chiao, C. H. and Hamada, M. (1996), “Robust Reliability for Light Emitting Diodes Using Degradation Measurements..” Quality and Reliability Engineering International, Vol. 12, No. 2, pp.89–94.[ SCI][ EI]
Yu, H. F. and Chiao, C. H. (2000), “Designing a Degradation Experiment by Optimizing the Interval Estimation of the Percentile.” International Engineering Research, Vol. 2, No. 1, pp. 33–48.
Chiao, C. H. and Hamada, M. (2001), “Analyzing Experiments with Correlated Multiple Responses.” Journal of Quality Technology, Vol. 33, No. 4,pp. 451–465.[ EI][ SCI]
Chiao, C. H. and Hamada, M. (2001), “Analyzing Experiments with Degradation Data for Improving Reliability and for Achieving Robust Reliability.” Quality and Reliability Engineering International, Vol. 17, pp.333–344.[ SCI][ EI]
Chiao, C. H. and Wang, W. Y. (2002), “Reliability Improvement of Fluorescent Lamp Using Grey Forecasting Model.” Microelectronics Reliability, Vol. 42, No. 1, pp.127–134.[ EI]
Yu, H. F. and Chiao, C. H. (2002),“An Optimal Designed degradation Experiment for Reliability Improvement.” IEEE Transactions on Reliability, Vol. 51, No. 4, pp.427–433.[ SCI][EI]
Yu, H. F. and Chiao, C. H. (2002), “Designing an Accelerated Degradation Experiment by Optimizing the Interval Estimation of the Mean-time-to -failure.” Journal of the Chinese Institute of Industrial Engineers, (國科會優等期刊獎), Vol. 19, No. 5, pp.23–33.
Tseng, S. T. and Chiao, C. H. (1994),“A Case Study of Reliability Improvement via an L4(2)3 Design.”ISSAT International Conference on Reliability and Quality in Design.
Chiao, C. H. and Dharmadhikari, A. D. (1995),“Selection of the Best Brand Using Nonparametric Methods.”Second Spring Research Conference, University of Waterloo, Canada.
Chiao, C. H. (1997),“Reliability Inference for Accelerated Life Test Data from Common Scale-shape Family.”The 51th Session of the International Statistical Institute, Istanbul, Tukey.
Yu, H. F. and Chiao, C. H. (1999),“An Optimal Designed Degradation Experiment for Reliability Improvement.”The 52nd Session of the International Statistical Institute, Helsinki, Finland.
Yu, H. F. and Chiao, C. H. (2000),“Designing and Accelerated Degradation Experiment.”The second International Conference on Mathematics in Reliability, Bordeaux, France.
Chiao, C. H. and Hamada, M. (2001),“On Improving Quality with Multiple Responses.”The Second International Symposium on Business and Industrial Statistics, Yokohama, Japan.
八十四學年度,行政院國家科學委員會—甲種研究獎勵,“A Classification Rule Arising from Accelerated Life Test”。 八十五學年度,行政院國家科學委員會—甲種研究獎勵,“Applying Locally Optimal Criterion for Classifying Highly-reliable Products with a Control”。
八十六學年度,東吳大學學術著作獎助,“Using Degradation Data from a Fractional Factorial Experiment to Improve Fluorescent Lamp Reliability”。
八十七學年度,行政院國家科學委員會—甲種研究獎勵,「衰變資料應用於可靠度改善之研究」。
八十七學年度,東吳大學學術著作獎助,“Robust Reliability for Light Emitting Diodes Using Degradation Measurements.”
Chiao, C. H. and Hamada, M. (1995),“Experiments with Degradation Data for Improving Reliability and for Achieving Robust Reliability.”The Institute for Improvement in Quality and Productivity, RR-95-10, University of Waterloo, Canada.